Features Introduction

By continuously projecting sinusoidal phase information fringe patterns at high speed, various images suitable for defect detection are generated.

● More suitable for highly reflective surfaces

By utilizing the principle of specular reflection, it eliminates the effects of surface texture features and random uneven lighting. highlighting tiny defects that were previously impossible to image.



● Outputs various images:

Includes computed images such as diffuse reflction, specular reflection, gloss ratio, shape diagram, and standard diagram. enabling layered imagng of product contours and timy defects


● Line scan

Capable of achieving high-speed uniform scanning imaging at up to 220 kHz for cylindrical, rolled, and other continuous highly reflectie materials.

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